04.05. Department of Pyhsics

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Author:  Aygün, Gülnur
Date Issued:  [2010 TO 2019]
Subject:  FTIR
Subject:  Reactive RF sputtering

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Issue DateTitleAuthor(s)
1Sep-2018Comparision of in situ spectroscopic ellipsometer and ex situ x-ray photoelectron spectroscopy depth profiling analysis of HfO2/Hf/Si multilayer structureCantaş, Ayten; Özyüzer, Lütfi ; Aygün, Gülnur