| Issue Date | Title | Author(s) |
| 1 | Sep-2018 | Comparision of in situ spectroscopic ellipsometer and ex situ x-ray photoelectron spectroscopy depth profiling analysis of HfO2/Hf/Si multilayer structure | Cantaş, Ayten; Özyüzer, Lütfi ; Aygün, Gülnur |
| 2 | 2019 | Effect of defects and secondary phases in Cu2ZnSnS4 absorber material on the performance of Zn(O,S) buffered devices | Türkoğlu, Fulya; Köseoğlu, Hasan; Cantaş, Ayten; Akça, Fatime Gülşah; Meriç, Ece; Buldu, Dilara Gökçen; Aygün, Gülnur |
| 3 | Nov-2010 | Ge nanocrystals embedded in SiO2 in MOS based radiation sensors | Aktağ, Aliekber; Yılmaz, Ercan; Mogaddam, Nader A.P.; Aygün, Gülnur ; Cantaş, Ayten; Turan, Raşit |
| 4 | Aug-2015 | Growth of Cu2ZnSnS4 absorber layer on flexible metallic substrates for thin film solar cell applications | Yazıcı, Şebnem; Olgar, Mehmet Ali; Akça, Fatime Gülşah; Cantaş, Ayten; Kurt, Metin ; Aygün, Gülnur ; Tarhan, Enver ; Yanmaz, Ekrem; Özyüzer, Lütfi |
| 5 | Nov-2014 | Impact of incorporated oxygen quantity on optical, structural and dielectric properties of reactive magnetron sputter grown high-? HfO2/Hf/Si thin film | Cantaş, Ayten; Aygün, Gülnur ; Turan, Raşit |
| 6 | Jan-2018 | Influence of sulfurization temperature on Cu2ZnSnS4 absorber layer on flexible titanium substrates for thin film solar cells | Buldu, Dilara Gökçen; Cantaş, Ayten; Türkoğlu, Fulya; Akça, Fatime Gülşah; Meriç, Ece; Özdemir, Mehtap ; Tarhan, Enver ; Özyüzer, Lütfi ; Aygün, Gülnur |
