03.04. Department of Computer Engineering

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Subject:  Mutation testing
Subject:  Model based testing
Subject:  Reliability theory
Fulltext:  No Fulltext
Subject:  Pattern matching
Author:  Turk, E.
Subject:  Test generations
Author:  Kilincceker, O.
Subject:  Faulty hardware
Date Issued:  2022
Subject:  Test sequence
Subject:  Behavioral model

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Issue DateTitleAuthor(s)
12022Model-based ideal testing of hardware description language (HDL) programs