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Özyüzer, Lütfi
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Ozyuzer, Lutfi
Özyüzer, L.
Ozyuzer, L.
Özyüzer, L
Ozyuzer, L
Özyüzer, L.
Ozyuzer, L.
Özyüzer, L
Ozyuzer, L
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lutfiozyuzer@iyte.edu.tr
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Turkey
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Results 1-1 of 1 (Search time: 0.0 seconds).
Issue Date | Title | Author(s) | |
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1 | Sep-2018 | Comparision of in situ spectroscopic ellipsometer and ex situ x-ray photoelectron spectroscopy depth profiling analysis of HfO2/Hf/Si multilayer structure | Cantaş, Ayten; Özyüzer, Lütfi ; Aygün, Gülnur |