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Applications of Transparent Conductive Indium Tin Oxide Films in Automotive and Vitrifications Industries

dc.contributor.advisor Selamet, Yusuf
dc.contributor.author Tuna, Öcal
dc.contributor.author Selamet, Yusuf
dc.contributor.other 04.05. Department of Pyhsics
dc.contributor.other 04. Faculty of Science
dc.contributor.other 01. Izmir Institute of Technology
dc.date.accessioned 2014-07-22T13:53:06Z
dc.date.available 2014-07-22T13:53:06Z
dc.date.issued 2009
dc.description Thesis (Master)--Izmir Institute of Technology, Physics, Izmir, 2009 en_US
dc.description Includes bibliographical references (leaves: 76-79) en_US
dc.description Text in English; Abstract:Turkish and English en_US
dc.description xii, 79 leaves en_US
dc.description.abstract Due to its unique electrical and optical properties, highly doped n-type Indium tin oxide used for various applications such as smart glass, LCDs, OLEDs, solar cells and car windows. In this study Indium Tin Oxide (ITO) thin films were grown by both DC and RF magnetron sputtering techniques. To know deposition rate of ITO, system was calibrated for both DCMS and RFMS and then ITO were grown on glass substrate with the thickness of 70 nm and 40 nm by changing substrate temperature. The effect of substrate temperature, film thickness and sputtering method on structural, electrical and optical properties were investigated. Wan der Pauw method was used for electrical characterization and to use this method properly, we patterned ITO thin films by photolithography and Ion beam etching techniques. The results show that substrate temperature and film thickness substantially affects the film properties, especially crystallization and resistivity. The thin films grown at the lower than 150 oC showed amorphous structure. However, crystallization was detected with the further increase of substrate temperature. Substrate temperature and film thickness increment were lead to increase band gap of ITO which can be explained by BMS. Band gap of ITO was calculated to be about 3.64 eV at the substrate temperature of 150 oC, and it widened with substrate temperature increment. From electrical measurements the resistivity at room temperature was obtained 1.28*10 and 1.29*10 cm, for DC and RF sputtered films, respectively. We also measured temperature dependence resistivity and the Hall coefficient of the films, and we calculated carrier concentration and Hall mobility. en_US
dc.identifier.uri http://hdl.handle.net/11147/4065
dc.language.iso en en_US
dc.publisher Izmir Institute of Technology en_US
dc.rights info:eu-repo/semantics/openAccess en_US
dc.subject.lcc QC611.8.M4 .T92 2009 en
dc.subject.lcsh Metal oxide semiconductors en
dc.subject.lcsh Indium en
dc.subject.lcsh Thin films en
dc.subject.lcsh Tin alloys en
dc.title Applications of Transparent Conductive Indium Tin Oxide Films in Automotive and Vitrifications Industries en_US
dc.type Master Thesis en_US
dspace.entity.type Publication
gdc.author.institutional Tuna, Öcal
gdc.coar.access open access
gdc.coar.type text::thesis::master thesis
gdc.description.department Thesis (Master)--İzmir Institute of Technology, Physics en_US
gdc.description.publicationcategory Tez en_US
gdc.description.scopusquality N/A
gdc.description.wosquality N/A
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