Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/10502
Full metadata record
DC FieldValueLanguage
dc.contributor.authorTakan, Savaş-
dc.contributor.authorAyav, Tolga-
dc.date.accessioned2021-01-24T18:44:57Z-
dc.date.available2021-01-24T18:44:57Z-
dc.date.issued2020-
dc.identifier.issn1300-0632-
dc.identifier.issn1303-6203-
dc.identifier.urihttps://doi.org/10.3906/elk-1909-90-
dc.identifier.urihttps://hdl.handle.net/11147/10502-
dc.identifier.urihttps://search.trdizin.gov.tr/yayin/detay/514055-
dc.description.abstractMutation analysis is a widely used technique to evaluate the effectiveness of test cases in both hardware and software testing. The original model is mutated systematically under certain fault assumptions and test cases are checked against the mutants created to see whether the test cases can detect the faults or not. Mutation analysis is usually a computationally intensive task, particularly in finite state machine (FSM) testing due to a possibly huge amount of mutants. Random selection could be a practical reduction method under the assumption that each mutant is identical in terms of the probability of occurrence of its associating fault. The present study proposes a mutant selection method based on Fourier analysis of Boolean functions. Fourier helps to identify the most effective transitions on the output so that the mutants related to those transitions can be selected. Such mutants are considered more important since they are more likely to be killed. To evaluate the method, test cases are generated by the well-known W method, which has the capability of detecting every potential fault. The original and reduced sets of mutants are compared with respect to their importance values. Evaluations show that the mutants selected by the proposed technique are more effective, which reduces the cost of mutation analysis without sacrificing the performance of the mutation analysis.en_US
dc.language.isoenen_US
dc.publisherTürkiye Klinikleri Journal of Medical Sciencesen_US
dc.relation.ispartofTurkish Journal of Electrical Engineering and Computer Sciencesen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectMutation analysisen_US
dc.subjectFinite state machineen_US
dc.subjectFourier transformationen_US
dc.subjectW methoden_US
dc.titleMutant selection by using Fourier expansionen_US
dc.typeArticleen_US
dc.institutionauthorTakan, Savaş-
dc.institutionauthorAyav, Tolga-
dc.departmentİzmir Institute of Technology. Computer Engineeringen_US
dc.identifier.volume28en_US
dc.identifier.issue5en_US
dc.identifier.startpage2750en_US
dc.identifier.endpage2767en_US
dc.identifier.wosWOS:000576682500009en_US
dc.identifier.scopus2-s2.0-85095793977en_US
dc.relation.publicationcategoryMakale - Ulusal Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.identifier.doi10.3906/elk-1909-90-
dc.relation.doi10.3906/elk-1909-90en_US
dc.coverage.doi10.3906/elk-1909-90en_US
dc.identifier.trdizinid514055en_US
dc.identifier.wosqualityQ4-
dc.identifier.scopusqualityQ3-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
item.fulltextWith Fulltext-
item.languageiso639-1en-
item.grantfulltextopen-
item.openairetypeArticle-
crisitem.author.dept03.04. Department of Computer Engineering-
crisitem.author.dept03.04. Department of Computer Engineering-
Appears in Collections:Computer Engineering / Bilgisayar Mühendisliği
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
TR Dizin İndeksli Yayınlar / TR Dizin Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
Files in This Item:
File SizeFormat 
Mutant selection.pdf392.62 kBAdobe PDFView/Open
Show simple item record



CORE Recommender

SCOPUSTM   
Citations

1
checked on Apr 5, 2024

WEB OF SCIENCETM
Citations

2
checked on Mar 23, 2024

Page view(s)

202
checked on Apr 15, 2024

Download(s)

70
checked on Apr 15, 2024

Google ScholarTM

Check




Altmetric


Items in GCRIS Repository are protected by copyright, with all rights reserved, unless otherwise indicated.