Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/2033
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dc.contributor.authorGüneş, Mehmet-
dc.contributor.authorGöktaş, Oktay-
dc.contributor.authorOkur, Salih-
dc.contributor.authorIşık, Nebile-
dc.contributor.authorCarius, Reinhard-
dc.contributor.authorKlomfaß, Josef-
dc.contributor.authorFinger, Friedhelm-
dc.date.accessioned2016-08-02T11:12:20Z
dc.date.available2016-08-02T11:12:20Z
dc.date.issued2005-02
dc.identifier.citationGüneş, M., Göktaş, O., Okur, S., Işık, N., Carius, R., Klomfaß, J., and Finger, F. (2005). Sub-bandgap absorption spectroscopy and minority carrier transport properties of hydrogenated microcrystalline silicon thin films. Journal of Optoelectronics and Advanced Materials, 7(1), 161-168.en_US
dc.identifier.issn1454-4164
dc.identifier.issn1454-4164-
dc.identifier.urihttp://hdl.handle.net/11147/2033
dc.description.abstractHydrogenated microcrystalline silicon thin films have been prepared using HW-CVD and VHF-PECVD techniques with different silane concentrations. The steady-state photoconductivity, dual beam photoconductivity, photothermal deflection spectroscopy and steady-state photocarrier grating (SSPG) methods have been used to investigate the optical and electronic properties of the films. Two different sub-bandgap absorption methods have been applied and analyzed to obtain a better insight into the electronic states involved. For some films, differences existed in the optical absorption spectra when the measurements were carried out through the film side and through the substrate side. In addition, for some films, fringe patterns remained on the spectrum after the calculation of the fringe free absorption spectrum, which indicates that structural inhomogeneities were present throughout the film. Finally, minority carrier diffusion lengths deduced from the SSPG measurements were investigated as a function of the crystalline volume fraction (I c RS) obtained from Raman spectroscopy. The longest diffusion lengths and lowest sub-bandgap absorption coefficients were obtained for films deposited in the region of the transition to the amorphous growth.en_US
dc.language.isoenen_US
dc.publisherNational Institute of Optoelectronicsen_US
dc.relation.ispartofJournal of Optoelectronics and Advanced Materialsen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectDual beam photoconductivityen_US
dc.subjectHydrogenated microcrystalline siliconen_US
dc.subjectSteady-state photocarrier gratingen_US
dc.subjectSub-bandgap absorptionen_US
dc.subjectThin filmsen_US
dc.titleSub-bandgap absorption spectroscopy and minority carrier transport properties of hydrogenated microcrystalline silicon thin filmsen_US
dc.typeConference Objecten_US
dc.authoridTR1299en_US
dc.authoridTR12208en_US
dc.institutionauthorGüneş, Mehmet-
dc.institutionauthorGöktaş, Oktay-
dc.institutionauthorOkur, Salih-
dc.institutionauthorIşık, Nebile-
dc.departmentİzmir Institute of Technology. Physicsen_US
dc.identifier.volume7en_US
dc.identifier.issue1en_US
dc.identifier.startpage161en_US
dc.identifier.endpage168en_US
dc.identifier.wosWOS:000228522700020en_US
dc.identifier.scopus2-s2.0-15244360149en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
local.message.claim2022-06-16T11:22:40.679+0300|||rp01576|||submit_approve|||dc_contributor_author|||None*
dc.identifier.wosqualityQ2-
dc.identifier.scopusqualityQ2-
item.openairetypeConference Object-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.fulltextWith Fulltext-
item.languageiso639-1en-
item.cerifentitytypePublications-
item.grantfulltextopen-
crisitem.author.dept04.05. Department of Pyhsics-
crisitem.author.dept04.05. Department of Pyhsics-
Appears in Collections:Physics / Fizik
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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