Please use this identifier to cite or link to this item:
https://hdl.handle.net/11147/2221
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Göktaş, Oktay | - |
dc.contributor.author | Işık, Nebile | - |
dc.contributor.author | Okur, Salih | - |
dc.contributor.author | Güneş, Mehmet | - |
dc.contributor.author | Carius, Reinhard | - |
dc.contributor.author | Klomfaß, Josef | - |
dc.contributor.author | Finger, Friedhelm | - |
dc.date.accessioned | 2016-10-12T12:02:22Z | |
dc.date.available | 2016-10-12T12:02:22Z | |
dc.date.issued | 2006-04 | |
dc.identifier.citation | Göktaş, O., Işık, N., Okur, S., Güneş, M., Carius, R., Klomfaß, J., and Finger, F.(2006). Sub-bandgap optical absorption spectroscopy of hydrogenated microcrystalline silicon thin films prepared using hot-wire CVD (Cat-CVD) process. Thin Solid Films, 501(1-2), 121-124. doi:10.1016/j.tsf.2005.07.137 | en_US |
dc.identifier.issn | 0040-6090 | |
dc.identifier.issn | 0040-6090 | - |
dc.identifier.uri | http://doi.org/10.1016/j.tsf.2005.07.137 | |
dc.identifier.uri | http://hdl.handle.net/11147/2221 | |
dc.description | Proceedings of the Third International Conference on Hot-Wire; 23 August 2004 through 27 August 2004 | en_US |
dc.description.abstract | Hydrogenated microcrystalline silicon (μc-Si:H) thin films with different silane concentration (SC) have been prepared using the HW-CVD technique. Dual beam photoconductivity (DBP), photothermal deflection spectroscopy (PDS), and transmission measurements have been used to investigate the optical properties of the μc-Si:H films. Two different sub-bandgap absorption, α(hν), methods have been applied and analyzed to obtain a better insight into the electronic states involved. A good agreement has been obtained in the absorption spectrum obtained from the PDS and DBP measurements at energies above the bandgap. Differences between PDS and DBP spectra exist below the bandgap energy where DBP spectra always give lower α(hν) values and show a dependence on the SC. For some films, differences exist in the α(hν) spectra when the DBP measurements are carried out through the film and substrate side. In addition, for some films, there remains fringe pattern left on the spectrum after the calculation of the fringe-free absorption spectrum, which indicates structural inhomogeneities present throughout the film. | en_US |
dc.description.sponsorship | TÜBİTAK project number TBAG-U/14 | en_US |
dc.language.iso | en | en_US |
dc.publisher | Elsevier Ltd. | en_US |
dc.relation.ispartof | Thin Solid Films | en_US |
dc.rights | info:eu-repo/semantics/openAccess | en_US |
dc.subject | Crystalline materials | en_US |
dc.subject | Electrical properties and measurements | en_US |
dc.subject | Hot-wire deposition | en_US |
dc.subject | Microcrystalline silicon thin films | en_US |
dc.subject | Thin films | en_US |
dc.title | Sub-Bandgap Optical Absorption Spectroscopy of Hydrogenated Microcrystalline Silicon Thin Films Prepared Using Hot-Wire Cvd (cat-Cvd) Process | en_US |
dc.type | Conference Object | en_US |
dc.authorid | TR31998 | en_US |
dc.authorid | TR166758 | en_US |
dc.authorid | TR1299 | en_US |
dc.institutionauthor | Göktaş, Oktay | - |
dc.institutionauthor | Işık, Nebile | - |
dc.institutionauthor | Okur, Salih | - |
dc.institutionauthor | Güneş, Mehmet | - |
dc.department | İzmir Institute of Technology. Physics | en_US |
dc.identifier.volume | 501 | en_US |
dc.identifier.issue | 1-2 | en_US |
dc.identifier.startpage | 121 | en_US |
dc.identifier.endpage | 124 | en_US |
dc.identifier.wos | WOS:000235979600029 | en_US |
dc.identifier.scopus | 2-s2.0-32644476688 | en_US |
dc.relation.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | en_US |
dc.identifier.doi | 10.1016/j.tsf.2005.07.137 | - |
dc.relation.doi | 10.1016/j.tsf.2005.07.137 | en_US |
dc.coverage.doi | 10.1016/j.tsf.2005.07.137 | en_US |
local.message.claim | 2022-06-16T11:22:40.679+0300 | * |
local.message.claim | |rp01576 | * |
local.message.claim | |submit_approve | * |
local.message.claim | |dc_contributor_author | * |
local.message.claim | |None | * |
dc.identifier.wosquality | Q3 | - |
dc.identifier.scopusquality | Q2 | - |
item.fulltext | With Fulltext | - |
item.openairetype | Conference Object | - |
item.openairecristype | http://purl.org/coar/resource_type/c_18cf | - |
item.languageiso639-1 | en | - |
item.cerifentitytype | Publications | - |
item.grantfulltext | open | - |
crisitem.author.dept | 04.05. Department of Pyhsics | - |
crisitem.author.dept | 04.05. Department of Pyhsics | - |
Appears in Collections: | Physics / Fizik Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection |
CORE Recommender
SCOPUSTM
Citations
9
checked on Dec 6, 2024
WEB OF SCIENCETM
Citations
6
checked on Oct 26, 2024
Page view(s)
266
checked on Dec 9, 2024
Download(s)
306
checked on Dec 9, 2024
Google ScholarTM
Check
Altmetric
Items in GCRIS Repository are protected by copyright, with all rights reserved, unless otherwise indicated.