Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/3220
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dc.contributor.advisorTari, Süleymanen
dc.contributor.authorOğuz, Kaan-
dc.date.accessioned2014-07-22T13:51:07Z-
dc.date.available2014-07-22T13:51:07Z-
dc.date.issued2006en
dc.identifier.urihttp://hdl.handle.net/11147/3220-
dc.descriptionThesis (Master)--Izmir Institute of Technology, Physics, Izmir, 2006en
dc.descriptionIncludes bibliographical references (leaves: 57-61)en
dc.descriptionText in English; Abstract:Turkish and Englishen
dc.descriptionx, 61 leavesen
dc.description.abstractIn this thesis, we are proposing to fabricate and structurally characterize Fe/TaOx/Fe magnetic multilayers as an initiative work towards magnetic tunnel junction (MTJ) structures with TaOx spacer layer. The multilayer structures were grown by magnetron sputtering technique and characterized by X-Ray Diffraction (XRD), Atomic Force Microscopy (AFM), and Scanning Electron Microscopy (SEM). Ellipsometry was used to find the refractive index and the hysteresis loops were taken by SQUID Magnetometer. It was found that Fe grew 45 degree tilted epitaxial single crystal on Si (001) substrate at room temperature. Ta growth on silicon had poor crystal quality due to large lattice mismatch between tantalum and silicon however Ta single layer on Fe was found to be single crystal with 0.72 FWHM. Reactive oxidation of Ta film resulted in formation of amorphous Ta2O5 with refractive index of 2.1. Fe, Ta, and TaOx single layer films were found to be uniform and smooth on silicon substrate. Bilayer of Fe/Ta and Fe/TaOx were also investigated to understand the behavior of single layer films on top of each other. Multilayers with Ta and TaOx spacer layers were successfully grown and these multilayers showed good structural properties. Furthermore, hysteresis loops of Fe films as thin as 50 nm showed magnetization comparable with the bulk Fe with the coercive field of 20 Oe.en
dc.language.isoenen_US
dc.publisherIzmir Institute of Technologyen
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subject.lccQC176.9.M84 .O35 2006en
dc.subject.lcshThin films, Multilayered--Magnetic propertiesen
dc.subject.lcshMagnetic materialsen
dc.titleGrowth and structural characterization of Fe/TaOx/Fe magnetic multilayersen_US
dc.typeMaster Thesisen_US
dc.institutionauthorOğuz, Kaan-
dc.departmentThesis (Master)--İzmir Institute of Technology, Physicsen_US
dc.relation.publicationcategoryTezen_US
item.languageiso639-1en-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
item.grantfulltextopen-
item.fulltextWith Fulltext-
item.openairetypeMaster Thesis-
Appears in Collections:Master Degree / Yüksek Lisans Tezleri
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