Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/4671
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dc.contributor.authorGüneş, Mehmet-
dc.contributor.authorAkdaş, Deniz-
dc.contributor.authorGöktaş, Oktay-
dc.contributor.authorCarius, Reinhard-
dc.contributor.authorKlomfaß, Josef-
dc.contributor.authorFinger, Friedhelm-
dc.date.accessioned2016-05-27T11:02:29Z
dc.date.available2016-05-27T11:02:29Z
dc.date.issued2003-10
dc.identifier.citationGüneş, M., Akdaş, D., Göktaş, O., Carius, R., Klomfaß, J., and Finger, F. (2003). Photoconductivity spectroscopy in hydrogenated microcrystalline silicon thin films. Journal of Materials Science: Materials in Electronics, 14(10-12), 729-730. doi:10.1023/A:1026147624811en_US
dc.identifier.issn0957-4522
dc.identifier.issn0957-4522-
dc.identifier.urihttp://doi.org/10.1023/A:1026147624811
dc.identifier.urihttp://hdl.handle.net/11147/4671
dc.description.abstractSteady-state photoconductivity and sub-bandgap absorption measurements by the dual-beam photoconductivity (DBF) method were carried out on undoped hydrogenated microcrystalline silicon thin films prepared by VHF-PECVD and hot-wire chemical vapor deposition. The results are compared with those of the constant-photocurrent method (CPM) and photothermal deflection spectroscopy (PDS). It is found that DBP, CPM, and PDS provide complementary data on the optoelectronic processes in microcrystalline silicon.en_US
dc.description.sponsorshipTÜBİTAKen_US
dc.language.isoenen_US
dc.publisherSpringer Verlagen_US
dc.relation.ispartofJournal of Materials Science: Materials in Electronicsen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectThin filmsen_US
dc.subjectPhotothermal deflection spectroscopy (PDS)en_US
dc.subjectChemical vapor depositionen_US
dc.subjectCrystalline materialsen_US
dc.subjectHydrogenationen_US
dc.titlePhotoconductivity spectroscopy in hydrogenated microcrystalline silicon thin filmsen_US
dc.typeConference Objecten_US
dc.authoridTR1299en_US
dc.institutionauthorGüneş, Mehmet-
dc.institutionauthorAkdaş, Deniz-
dc.institutionauthorGöktaş, Oktay-
dc.departmentİzmir Institute of Technology. Physicsen_US
dc.identifier.volume14en_US
dc.identifier.issue10-12en_US
dc.identifier.startpage729en_US
dc.identifier.endpage730en_US
dc.identifier.wosWOS:000185962400030en_US
dc.identifier.scopus2-s2.0-0242348718en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.identifier.doi10.1023/A:1026147624811-
dc.relation.doi10.1023/A:1026147624811en_US
dc.coverage.doi10.1023/A:1026147624811en_US
local.message.claim2022-06-16T11:22:40.679+0300|||rp01576|||submit_approve|||dc_contributor_author|||None*
dc.identifier.wosqualityQ3-
dc.identifier.scopusqualityQ2-
item.grantfulltextopen-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
item.openairetypeConference Object-
item.languageiso639-1en-
item.fulltextWith Fulltext-
crisitem.author.dept04.05. Department of Pyhsics-
Appears in Collections:Physics / Fizik
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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