Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/5429
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dc.contributor.authorYelken Özek, Gülnihal-
dc.contributor.authorPolat, Mehmet-
dc.date.accessioned2017-04-27T14:00:45Z
dc.date.available2017-04-27T14:00:45Z
dc.date.issued2014-05
dc.identifier.citationYelken Özek, G., and Polat, M. (2014). Determination of electrostatic potential distribution by atomic force microscopy (AFM) on model silica and alumina surfaces in aqueous electrolyte solutions. Applied Surface Science, 301, 149-155. doi:10.1016/j.apsusc.2014.02.022en_US
dc.identifier.issn0169-4332
dc.identifier.issn0169-4332-
dc.identifier.issn1873-5584-
dc.identifier.urihttp://doi.org/10.1016/j.apsusc.2014.02.022
dc.identifier.urihttp://hdl.handle.net/11147/5429
dc.description.abstractAFM was employed as a physicochemical probe to determine the electrostatic potential distribution quantitatively on selected ideal oxide surfaces (quartz 0 0 0 1 and sapphire 0 0 0 1) in aqueous media. The force of interaction between a silicon nitride tip and the oxide surface was measured at a given point under well-defined solution conditions. Relevant theories were used to isolate the electrostatic component from the total force of interaction which was then employed to estimate the surface potential at that point. Repeating the procedure on selected locations generated a potential map of the surface. Comparison of these potentials with those obtained from independent electrokinetic measurements confirmed the validity of the approach. © 2014 Elsevier B.V. All rights reserved.en_US
dc.description.sponsorshipTUBITAK (109T695)en_US
dc.language.isoenen_US
dc.publisherElsevier Ltd.en_US
dc.relationinfo:eu-repo/grantAgreement/TUBITAK/TBAG/109T695en_US
dc.relation.ispartofApplied Surface Scienceen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectAtomic force microscopyen_US
dc.subjectDLVO theoryen_US
dc.subjectForce curveen_US
dc.subjectSurface potential mapen_US
dc.subjectElectrostaticsen_US
dc.titleDetermination of electrostatic potential distribution by atomic force microscopy (AFM) on model silica and alumina surfaces in aqueous electrolyte solutionsen_US
dc.typeArticleen_US
dc.authoridTR113946en_US
dc.authoridTR20247en_US
dc.institutionauthorYelken Özek, Gülnihal-
dc.institutionauthorPolat, Mehmet-
dc.departmentİzmir Institute of Technology. Chemical Engineeringen_US
dc.identifier.volume301en_US
dc.identifier.startpage149en_US
dc.identifier.endpage155en_US
dc.identifier.wosWOS:000335095600024en_US
dc.identifier.scopus2-s2.0-84897915485en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.identifier.doi10.1016/j.apsusc.2014.02.022-
dc.relation.doi10.1016/j.apsusc.2014.02.022en_US
dc.coverage.doi10.1016/j.apsusc.2014.02.022en_US
dc.identifier.wosqualityQ1-
dc.identifier.scopusqualityQ1-
item.openairetypeArticle-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.fulltextWith Fulltext-
item.languageiso639-1en-
item.cerifentitytypePublications-
item.grantfulltextopen-
crisitem.author.dept03.02. Department of Chemical Engineering-
crisitem.author.dept03.02. Department of Chemical Engineering-
Appears in Collections:Chemical Engineering / Kimya Mühendisliği
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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