Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/5962
Full metadata record
DC FieldValueLanguage
dc.contributor.authorBelli, Fevzi-
dc.contributor.authorBeyazıt, Mutlu-
dc.date.accessioned2017-07-19T11:33:37Z-
dc.date.available2017-07-19T11:33:37Z-
dc.date.issued2015-02-01-
dc.identifier.citationBelli, F., and Beyazıt, M. (2015). Exploiting model morphology for event-based testing. IEEE Transactions on Software Engineering, 41(2), 113-134. doi:10.1109/TSE.2014.2360690en_US
dc.identifier.issn0098-5589-
dc.identifier.urihttps://doi.org/10.1109/TSE.2014.2360690-
dc.identifier.urihttp://hdl.handle.net/11147/5962-
dc.description.abstractModel-based testing employs models for testing. Model-based mutation testing (MBMT) additionally involves fault models, called mutants, by applying mutation operators to the original model. A problem encountered with MBMT is the elimination of equivalent mutants and multiple mutants modeling the same faults. Another problem is the need to compare a mutant to the original model for test generation. This paper proposes an event-based approach to MBMT that is not fixed on single events and a single model but rather operates on sequences of events of length k ≥ 1 and invokes a sequence of models that are derived from the original one by varying its morphology based on k. The approach employs formal grammars, related mutation operators, and algorithms to generate test cases, enabling the following: (1) the exclusion of equivalent mutants and multiple mutants; (2) the generation of a test case in linear time to kill a selected mutant without comparing it to the original model; (3) the analysis of morphologically different models enabling the systematic generation of mutants, thereby extending the set of fault models studied in related literature. Three case studies validate the approach and analyze its characteristics in comparison to random testing and another MBMT approach.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.relation.ispartofIEEE Transactions on Software Engineeringen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectGrammar-based testingen_US
dc.subjectModel based testingen_US
dc.subjectMutant selectionen_US
dc.subjectSoftware testingen_US
dc.subjectComputational grammarsen_US
dc.titleExploiting model morphology for event-based testingen_US
dc.typeArticleen_US
dc.institutionauthorBelli, Fevzi-
dc.departmentİzmir Institute of Technology. Computer Engineeringen_US
dc.identifier.volume41en_US
dc.identifier.issue2en_US
dc.identifier.startpage113en_US
dc.identifier.endpage134en_US
dc.identifier.wosWOS:000351460400001en_US
dc.identifier.scopus2-s2.0-84923068858en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.identifier.doi10.1109/TSE.2014.2360690-
dc.relation.doi10.1109/TSE.2014.2360690en_US
dc.coverage.doi10.1109/TSE.2014.2360690en_US
local.message.claim2022-06-03T14:16:59.009+0300|||rp00375|||submit_approve|||dc_contributor_author|||None*
dc.identifier.wosqualityQ1-
dc.identifier.scopusqualityQ1-
item.languageiso639-1en-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.grantfulltextopen-
item.cerifentitytypePublications-
item.fulltextWith Fulltext-
item.openairetypeArticle-
crisitem.author.dept03.04. Department of Computer Engineering-
Appears in Collections:Computer Engineering / Bilgisayar Mühendisliği
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
Files in This Item:
File Description SizeFormat 
5962.pdfMakale1.06 MBAdobe PDFThumbnail
View/Open
Show simple item record



CORE Recommender

SCOPUSTM   
Citations

11
checked on Feb 16, 2024

WEB OF SCIENCETM
Citations

7
checked on Jan 20, 2024

Page view(s)

382
checked on Feb 19, 2024

Download(s)

132
checked on Feb 19, 2024

Google ScholarTM

Check




Altmetric


Items in GCRIS Repository are protected by copyright, with all rights reserved, unless otherwise indicated.