Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/7067
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dc.contributor.authorTakan, Savaş-
dc.contributor.authorAyav, Tolga-
dc.date.accessioned2018-12-25T08:13:48Z-
dc.date.available2018-12-25T08:13:48Z-
dc.date.issued2018-
dc.identifier.citationTakan, S., and Ayav, T. (2018, September 10-12). Sonlu durum makinelerinin Fourier analizi tabanlı sınanması. In A. Tarhan and Murat E. (Eds.), paper presented at the 12th Turkish National Software Engineering Symposium, UYMS 2018; Istanbul; Turkey.en_US
dc.identifier.isbn1613-0073-
dc.identifier.urihttp://ceur-ws.org/Vol-2201/UYMS_YTM_2018_paper_17.pdf-
dc.identifier.urihttp://hdl.handle.net/11147/7067-
dc.description12th Turkish National Software Engineering Symposium, UYMS 2018; Istanbul; Turkey; 10 September 2018 through 12 September 2018en_US
dc.description.abstractSonlu durum makinesi (FSM), devre ve yazılım testlerinde yaygın kullanıma sahip bir modelleme tekniğidir. FSM'lerin testi için literatürde çeşitli yöntemler bulunmakla birlikte, modellerin büyümesi sonucu test kümesinin büyüklüğü, hata yakalama oranı ve test üretim süresi gibi konularda yüksek başarıma sahip alternatif test yöntemlerine ihtiyaç bulunmaktadır. Bu çalışma ikili fonksiyonların Fourier analizine dayanan yeni bir test oluşturma yöntemi önermektedir. İlk sonuçlar, fonksiyonun frekans bileşenlerinden yararlanarak oluşturulan test takımının daha yüksek bir performansa sahip olduğunu göstermektedir. Önerilen yöntem, karakteristiği, maliyeti ve hata yakalama oranı üzerinden literatürden seçilen iki yöntemle karşılaştırılmıştır.en_US
dc.description.abstractFinite State Machine (FSM), as a formal modeling technique to represent both circuits and software, has been widely used in testing. FSM testing is a well-studied subject and there are several test generation methods. However, the current increase in the demand for pervasive and safety critical systems as well as the increase in software size calls for more rigorous methods that can produce more effective test suites particularly in terms of size, time spent for test generation and fault detection ratio. In this study, we propose a new test generation method based on the Fourier analysis of Boolean functions. An analysis on the effects of the various frequency components of the function output allow us to generate test suites with better performance characteristics. We compare our F-method with the two existing methods.en_US
dc.language.isoenen_US
dc.publisherCEUR Workshop Proceedingsen_US
dc.relation.ispartof12th Turkish National Software Engineering Symposium, UYMS 2018en_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectFourier transformationen_US
dc.subjectUIO methoden_US
dc.subjectFinite state machineen_US
dc.subjectSoftware testingen_US
dc.titleSonlu durum makinelerinin Fourier analizi tabanlı sınanmasıen_US
dc.title.alternativeFourier analysis-based testing of finite state machinesen_US
dc.typeConference Objecten_US
dc.authoridTR114453en_US
dc.institutionauthorTakan, Savaş-
dc.institutionauthorAyav, Tolga-
dc.departmentİzmir Institute of Technology. Computer Engineeringen_US
dc.identifier.volume2201en_US
dc.identifier.scopus2-s2.0-85053694945en_US
dc.relation.publicationcategoryKonferans Öğesi - Ulusal - Kurum Öğretim Elemanıen_US
item.openairetypeConference Object-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.fulltextWith Fulltext-
item.languageiso639-1en-
item.cerifentitytypePublications-
item.grantfulltextopen-
crisitem.author.dept03.04. Department of Computer Engineering-
crisitem.author.dept03.04. Department of Computer Engineering-
Appears in Collections:Computer Engineering / Bilgisayar Mühendisliği
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
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