Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/7321
Title: High-speed imaging in noncontact atomic force microscopy
Authors: Balantekin, Müjdat
Keywords: Atomic force microscope
Eigenmode of a cantilever
High-speed AFM imaging
Noncontact mode
Issue Date: 2013
Publisher: CRC Press
Abstract: We analyze the high-speed operating method that we recently developed to be used in noncontact atomic force microscopes (AFM). We simulated the method on various samples and it is shown that the method can minimize the time spent for noncontact AFM imaging experiments. The initial simulation results showed that even with an ordinary AFM cantilever imaging speeds faster than 10 frames/second can be achieved.
Description: Nanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites - 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013; Washington, DC; United States; 12 May 2013 through 16 May 2013
URI: https://hdl.handle.net/11147/7321
ISBN: 9781482205817
Appears in Collections:Electrical - Electronic Engineering / Elektrik - Elektronik Mühendisliği
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection

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