Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/8785
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dc.contributor.authorBrar, Harpreet Singh-
dc.contributor.authorBalantekin, Müjdat-
dc.date.accessioned2020-07-18T08:31:25Z-
dc.date.available2020-07-18T08:31:25Z-
dc.date.issued2020-
dc.identifier.issn0957-0233-
dc.identifier.issn1361-6501-
dc.identifier.urihttps://doi.org/10.1088/1361-6501/ab8903-
dc.identifier.urihttps://hdl.handle.net/11147/8785-
dc.description.abstractWe study small (less than 10 mu m-long) high-frequency (greater than 1 MHz) cantilevers specially designed for visualization of biomolecular processes in high-speed atomic force microscopes. The frequency responses of the first three flexural eigenmodes are investigated for the modified geometries. It is found that the Q-factors can be significantly altered in the desired way by reengineering the cantilever geometry without affecting its main operational parameters, such as the spring constant and the resonance frequency of the first flexural eigenmode in an air environment. In addition, higher-order flexural resonances can be moved away from the fundamental resonance with these geometrical modifications. The Q-factors in liquid, on the other hand, do not show a significant difference due to high viscous damping of the medium. Regular cantilevers modified by a focused ion beam are used to demonstrate the validity of the finite element simulation model.en_US
dc.language.isoenen_US
dc.publisherIOP Publishingen_US
dc.relation.ispartofMeasurement Science and Technologyen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectAtomic force microscopyen_US
dc.subjectSmall high-frequency cantileveren_US
dc.subjectFlexural eigenmodeen_US
dc.subjectResonance frequencyen_US
dc.subjectQ-factoren_US
dc.titleManipulating the frequency response of small high-frequency atomic force microscope cantileversen_US
dc.typeArticleen_US
dc.institutionauthorBrar, Harpreet Singh-
dc.institutionauthorBalantekin, Müjdat-
dc.departmentİzmir Institute of Technology. Electrical and Electronics Engineeringen_US
dc.identifier.volume31en_US
dc.identifier.issue9en_US
dc.identifier.wosWOS:000544629000001en_US
dc.identifier.scopus2-s2.0-85087169754en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.identifier.doi10.1088/1361-6501/ab8903-
dc.relation.doi10.1088/1361-6501/ab8903en_US
dc.coverage.doi10.1088/1361-6501/ab8903en_US
dc.identifier.wosqualityQ3-
dc.identifier.scopusqualityQ2-
item.grantfulltextopen-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
item.openairetypeArticle-
item.languageiso639-1en-
item.fulltextWith Fulltext-
crisitem.author.dept03.05. Department of Electrical and Electronics Engineering-
Appears in Collections:Electrical - Electronic Engineering / Elektrik - Elektronik Mühendisliği
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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