Tuglular,T.Linschulte,M.2024-09-242024-09-242012978-076954743-5https://doi.org/10.1109/SERE-C.2012.9https://hdl.handle.net/11147/14724IEEE Reliability Society[No abstract available]eninfo:eu-repo/semantics/closedAccess[No Keyword Available]Message From the Mvv Workshop ChairsEditorial2-s2.0-8486692633510.1109/SERE-C.2012.9