04.05. Department of Pyhsics

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Author:  Okur, Salih
Author:  Güneş, Mehmet
Date Issued:  2006
Subject:  Raman spectroscopy

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Issue DateTitleAuthor(s)
1Apr-2006Diffusion length measurements of microcrystalline silicon thin films prepared by hot-wire/catalytic chemical vapor deposition (HWCVD)Okur, Salih ; Güneş, Mehmet ; Finger, Friedhelm; Carius, Reinhard