04.05. Department of Pyhsics
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| Issue Date | Title | Author(s) | |
|---|---|---|---|
| 1 | Apr-2006 | Diffusion length measurements of microcrystalline silicon thin films prepared by hot-wire/catalytic chemical vapor deposition (HWCVD) | Okur, Salih ; Güneş, Mehmet ; Finger, Friedhelm; Carius, Reinhard |