04.05. Department of Pyhsics

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Author:  Güneş, Mehmet
Subject:  Annealing
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Issue DateTitleAuthor(s)
1Apr-1997Differences in the densities of charged defect states and kinetics of Staebler-Wronski effect in undoped (nonintrinsic) hydrogenated amorphous silicon thin filmsGüneş, Mehmet ; Wronski, Christopher R.
2Feb-2005The effects of oxide thickness on the interface and oxide properties of metal-tantalum pentoxide-Si (MOS) capacitorsÖzdağ, Pınar; Atanassova, Elena; Güneş, Mehmet