03.05. Department of Electrical and Electronics Engineering
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| Issue Date | Title | Author(s) | |
|---|---|---|---|
| 1 | 2023 | Enhancing thickness determination of nanoscale dielectric films in phase diffraction-based optical characterization systems with radial basis function neural networks | Ataç, Enes; Karatay, Anıl ; Dinleyici, Mehmet Salih |
| 2 | 2020 | Nanoscale curved dielectric film characterization beyond diffraction limits using spatially structured illumination | Ataç, Enes; Dinleyici, Mehmet Salih |