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https://hdl.handle.net/11147/4671| Title: | Photoconductivity Spectroscopy in Hydrogenated Microcrystalline Silicon Thin Films | Authors: | Güneş, Mehmet Akdaş, Deniz Göktaş, Oktay Carius, Reinhard Klomfaß, Josef Finger, Friedhelm |
Keywords: | Thin films Photothermal deflection spectroscopy (PDS) Chemical vapor deposition Crystalline materials Hydrogenation |
Publisher: | Springer Verlag | Source: | Güneş, M., Akdaş, D., Göktaş, O., Carius, R., Klomfaß, J., and Finger, F. (2003). Photoconductivity spectroscopy in hydrogenated microcrystalline silicon thin films. Journal of Materials Science: Materials in Electronics, 14(10-12), 729-730. doi:10.1023/A:1026147624811 | Abstract: | Steady-state photoconductivity and sub-bandgap absorption measurements by the dual-beam photoconductivity (DBF) method were carried out on undoped hydrogenated microcrystalline silicon thin films prepared by VHF-PECVD and hot-wire chemical vapor deposition. The results are compared with those of the constant-photocurrent method (CPM) and photothermal deflection spectroscopy (PDS). It is found that DBP, CPM, and PDS provide complementary data on the optoelectronic processes in microcrystalline silicon. | URI: | http://doi.org/10.1023/A:1026147624811 http://hdl.handle.net/11147/4671 |
ISSN: | 0957-4522 0957-4522 |
| Appears in Collections: | Physics / Fizik Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection |
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