Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/4671
Title: Photoconductivity spectroscopy in hydrogenated microcrystalline silicon thin films
Authors: Güneş, Mehmet
Akdaş, Deniz
Göktaş, Oktay
Carius, Reinhard
Klomfaß, Josef
Finger, Friedhelm
Keywords: Thin films
Photothermal deflection spectroscopy (PDS)
Chemical vapor deposition
Crystalline materials
Hydrogenation
Issue Date: Oct-2003
Publisher: Springer Verlag
Source: Güneş, M., Akdaş, D., Göktaş, O., Carius, R., Klomfaß, J., and Finger, F. (2003). Photoconductivity spectroscopy in hydrogenated microcrystalline silicon thin films. Journal of Materials Science: Materials in Electronics, 14(10-12), 729-730. doi:10.1023/A:1026147624811
Abstract: Steady-state photoconductivity and sub-bandgap absorption measurements by the dual-beam photoconductivity (DBF) method were carried out on undoped hydrogenated microcrystalline silicon thin films prepared by VHF-PECVD and hot-wire chemical vapor deposition. The results are compared with those of the constant-photocurrent method (CPM) and photothermal deflection spectroscopy (PDS). It is found that DBP, CPM, and PDS provide complementary data on the optoelectronic processes in microcrystalline silicon.
URI: http://doi.org/10.1023/A:1026147624811
http://hdl.handle.net/11147/4671
ISSN: 0957-4522
0957-4522
Appears in Collections:Physics / Fizik
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection

Files in This Item:
File Description SizeFormat 
4671.pdfConference Paper219.13 kBAdobe PDFThumbnail
View/Open
Show full item record


CORE Recommender

SCOPUSTM   
Citations

4
checked on Mar 25, 2023

WEB OF SCIENCETM
Citations

4
checked on Mar 25, 2023

Page view(s)

96
checked on Mar 20, 2023

Download(s)

140
checked on Mar 20, 2023

Google ScholarTM

Check




Altmetric


Items in GCRIS Repository are protected by copyright, with all rights reserved, unless otherwise indicated.