Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/6357
Title: Reciprocal space mapping study of CdTe epilayer grown by molecular beam epitaxy on (2 1 1)B GaAs substrate
Authors: Polat, Mustafa
Arı, Ozan
Öztürk, Orhan
Selamet, Yusuf
Keywords: Dislocation
Lattice mismatch
Reciprocal space map
Shear strain
Tilting
Issue Date: Mar-2017
Publisher: IOP Publishing Ltd.
Source: Polat, M., Arı, O., Öztürk, O., and Selamet, Y. (2017). Reciprocal space mapping study of CdTe epilayer grown by molecular beam epitaxy on (2 1 1)B GaAs substrate. Materials Research Express, 4(3). doi:10.1088/2053-1591/aa61b8
Abstract: We examine high quality, single crystal CdTe epilayer grown by molecular beam epitaxy (MBE) on (2 1 1)B GaAs substrate using both positions and full width at half maximums (FWHMs) of reciprocal lattice points (RLPs). Our results demonstrate that reciprocal space mapping (RSM) is an effective way to study the structural characteristics of the high-index oriented epitaxial thin films having a large lattice mismatch with the substrate. The measurement method is defined first, and then the influence of shear strain ( xz) on the position of the (5 1 1) node of epilayer is clarified. It is concluded that the lattice tilting is likely to be related with the lattice mismatch. Nondestructive measurement of the dislocation density is achieved by applying the mosaic crystal model. The screw dislocation density, estimated to be 7.56×107 cm2, was calculated utilizing the broadened peakwidths of the asymmetric RLP of the epilayer lattice.
URI: http://doi.org/10.1088/2053-1591/aa61b8
http://hdl.handle.net/11147/6357
ISSN: 2053-1591
Appears in Collections:Physics / Fizik
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection

Files in This Item:
File Description SizeFormat 
6357.pdfMakale1.01 MBAdobe PDFThumbnail
View/Open
Show full item record

CORE Recommender

SCOPUSTM   
Citations

5
checked on Dec 3, 2022

WEB OF SCIENCETM
Citations

7
checked on Dec 3, 2022

Page view(s)

110
checked on Nov 28, 2022

Download(s)

208
checked on Nov 28, 2022

Google ScholarTM

Check

Altmetric


Items in GCRIS Repository are protected by copyright, with all rights reserved, unless otherwise indicated.