01. Izmir Institute of Technology

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Author:  Arı, Ozan

Results 1-13 of 13 (Search time: 0.047 seconds).

Issue DateTitleAuthor(s)
1Feb-2013Cleavage induced rows of missing atoms on ZnTe (110) surfaceÇelebi, Cem ; Arı, Ozan ; Senger, Ramazan Tuğrul 
22011Electronic, spintronic and transport properties of carbon based nanowiresArı, Ozan 
3Nov-2016Erratum to: MBE-grown CdTe layers on GaAs with in-assisted thermal deoxidationArı, Ozan ; Bilgilisoy, Elif ; Özçeri, Elif; Selamet, Yusuf 
4Nov-2015Growth and characterization of CdTe absorbers on GaAs by MBE for high concentration PV solar cellsArı, Ozan ; Polat, Mustafa ; Karakaya, Merve ; Selamet, Yusuf 
52020Hybrid J-aggregate-graphene phototransistorYakar, Ozan; Balcı, Osman; Uzlu, Burkay; Polat, Nahit ; Arı, Ozan ; Tunç, İlknur; Balcı, Sinan 
6Aug-2018Identifying threading dislocations in CdTe films by reciprocal space mapping and defect decoration etchingPolat, Mustafa ; Bilgilisoy, Elif ; Arı, Ozan ; Öztürk, Orhan ; Selamet, Yusuf 
72019Influence of electron-phonon interactions on the spectral properties of defects in hexagonal boron nitrideArı, Ozan ; Fırat, Volkan; Polat, Nihat; Çakır, Özgür.; Ateş, Serkan 
81-Oct-2016MBE-grown CdTe layers on GaAs with in-assisted thermal deoxidationArı, Ozan ; Bilgilisoy, Elif ; Özçeri, Elif; Selamet, Yusuf 
9Jul-2017Molecular beam epitaxy growth and characterization of CdTe heterostructures on GaAs-effect of interface, growth, and annealing conditions to crystal qualityArı, Ozan 
102017Nitrogen doping for facile and effective modification of graphene surfacesYanılmaz, Alper; Tomak, Aysel ; Akbalı, Barış; Bacaksız, Cihan; Özçeri, Elif; Arı, Ozan ; Senger, Ramazan Tuğrul ; Selamet, Yusuf ; Zareie, Hadi M.
11Mar-2017Reciprocal space mapping study of CdTe epilayer grown by molecular beam epitaxy on (2 1 1)B GaAs substratePolat, Mustafa ; Arı, Ozan ; Öztürk, Orhan ; Selamet, Yusuf 
122019Reversible energy transfer between a single defect in HBN and grapheneÖzçeri, Elif; Arı, Ozan ; Balcı, Sinan ; Kocabaş, Coşkun; Ateş, Serkan 
131-Jul-2016Surface roughness estimation of MBE grown CdTe/GaAs(211)B by ex-situ spectroscopic ellipsometryKarakaya, Merve ; Bilgilisoy, Elif ; Arı, Ozan ; Selamet, Yusuf