| Issue Date | Title | Author(s) |
| 1 | Apr-2006 | Diffusion length measurements of microcrystalline silicon thin films prepared by hot-wire/catalytic chemical vapor deposition (HWCVD) | Okur, Salih ; Güneş, Mehmet ; Finger, Friedhelm; Carius, Reinhard |
| 2 | Feb-2005 | Instability phenomena in microcrystalline silicon films | Finger, Friedhelm; Carius, Reinhard; Dylla, Thorsten; Klein, Stefan; Okur, Salih ; Güneş, Mehmet |
| 3 | Feb-2005 | Minority carrier properties of microcrystalline silicon thin films grown by HW-CVD and VHF-PECVD techniques | Okur, Salih ; Göktaş, Oktay; Güneş, Mehmet ; Finger, Friedhelm; Carius, Reinhard |
| 4 | Oct-2003 | Photoconductivity spectroscopy in hydrogenated microcrystalline silicon thin films | Güneş, Mehmet ; Akdaş, Deniz; Göktaş, Oktay; Carius, Reinhard; Klomfaß, Josef; Finger, Friedhelm |
| 5 | Aug-2003 | Stability of microcrystalline silicon for thin film solar cell applications | Finger, Friedhelm; Carius, Reinhard; Dylla, Thorsten; Klein, Stefan; Okur, Salih ; Güneş, Mehmet |
| 6 | Feb-2005 | Sub-bandgap absorption spectroscopy and minority carrier transport properties of hydrogenated microcrystalline silicon thin films | Güneş, Mehmet ; Göktaş, Oktay; Okur, Salih ; Işık, Nebile; Carius, Reinhard; Klomfaß, Josef; Finger, Friedhelm |
| 7 | Apr-2006 | Sub-bandgap optical absorption spectroscopy of hydrogenated microcrystalline silicon thin films prepared using hot-wire CVD (Cat-CVD) process | Göktaş, Oktay; Işık, Nebile; Okur, Salih ; Güneş, Mehmet ; Carius, Reinhard; Klomfaß, Josef; Finger, Friedhelm |
