Showing results 2 to 21 of 29
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| Issue Date | Title | Author(s) |
| May-2000 | 1/F Noise in Doped and Undoped Amorphous Silicon | Johanson, Robert E.; Güneş, Mehmet ; Kasap, Safa O. |
| Aug-2003 | 1/F Noise in Hydrogenated Amorphous Silicon-Germanium Alloys | Johanson, Robert E.; Güneş, Mehmet ; Kasap, Safa O. |
| 1999 | 1/F-noise Study of Undoped Intrinsic Hydrogenated Amorphous Silicon Thin Films | Güneş, Mehmet ; Johanson, Robert E.; Kasap, Safa O. |
| 2005 | Capacitance-voltage spectroscopy in metal-tantalum pentoxide (Ta-O)-silicon mos capacitors | Özdağ, Pınar |
| Oct-2003 | Conductance Fluctuations in A-Si:h: Effects of Alloying and Device Structure | Kasap, Safa O.; Güneş, Mehmet ; Johanson, Robert E.; Wang, Q.; Yang, Jeffrey; Guha, Subhendu |
| Apr-2002 | Conductance Fluctuations in Undoped Hydrogenated Amorphous Silicon-Germanium Alloy Thin Films | Güneş, Mehmet ; Johanson, Robert E.; Kasap, Safa O.; Yang, Jeffrey C.; Guha, Subhendu |
| May-2000 | Conductance Fluctuations in Undoped Intrinsic Hydrogenated Amorphous Silicon Films Prepared Using Several Deposition Techniques | Güneş, Mehmet ; Johanson, Robert E.; Kasap, Safa O. |
| Oct-2003 | Conductance Fluctuations in Vhf-Pecvd Grown Hydrogenated Microcrystalline Silicon Thin Films | Güneş, Mehmet ; Johanson, Robert E.; Kasap, Safa O.; Finger, Friedhelm; Lambertz, Andreas |
| Apr-1997 | Differences in the Densities of Charged Defect States and Kinetics of Staebler-Wronski Effect in Undoped (nonintrinsic) Hydrogenated Amorphous Silicon Thin Films | Güneş, Mehmet ; Wronski, Christopher R. |
| Apr-2006 | Diffusion Length Measurements of Microcrystalline Silicon Thin Films Prepared by Hot-wire/Catalytic Chemical Vapor Deposition (hwcvd) | Okur, Salih ; Güneş, Mehmet ; Finger, Friedhelm; Carius, Reinhard |
| 2005 | The Effects of Deposition Conditions on the Low Energy Absorption Spectrum of Microcrystalline Silicon Thin Films Prepared by Hwcvd Method | Işık, Nebile |
| 2005 | The Effects of Native and Light Induced Defects in the Optical and Electronic Properties of Hydrogenated Amorphous Silicon Germanium (a-Sige:h) Alloy Thin Films | Dönertaş Yavaş, Medine Elif |
| Feb-2010 | The Effects of Native and Light Induced Defects on Optoelectronic Properties of Hydrogenated Amorphous Silicon-Germanium (a-Sige:h) Alloy Thin Films | Güneş, Mehmet ; Yavaş, Mert; Klomfaß, Josef; Finger, Friedhelm |
| Feb-2005 | The Effects of Oxide Thickness on the Interface and Oxide Properties of Metal-Tantalum Pentoxide-Si (mos) Capacitors | Özdağ, Pınar; Atanassova, Elena; Güneş, Mehmet |
| 2007 | The Effects of Prior Nitridation Process of Silicon Surface and Different Metal Gates on the Capacitance Voltage Characteristics of Metal-Ta2o5 Mos Capacitor | Özben, Eylem Durğun |
| Mar-2004 | Electronic Transport Properties of Microcrystalline Silicon Thin Films Prepared by Vhf-Pecvd | Okur, Salih ; Güneş, Mehmet ; Göktaş, Oktay; Finger, Friedhelm; Carius, Reinhard |
| Feb-2005 | Instability Phenomena in Microcrystalline Silicon Films | Finger, Friedhelm; Carius, Reinhard; Dylla, Thorsten; Klein, Stefan; Okur, Salih ; Güneş, Mehmet |
| Feb-2005 | Light Induced Degradation of Hydrogenated Amorphous Silicon - Germanium Alloy (a-Sige:h) Thin Films | Dönertaş, M. Elif; Güneş, Mehmet |
| 2003 | Low Temperature Photoconductivity of Hydrogenated Amorphous Silicon (a-Si:h) Thin Flims | Erdoğan, Gökhan |
| Feb-2005 | Minority Carrier Properties of Microcrystalline Silicon Thin Films Grown by Hw-Cvd and Vhf-Pecvd Techniques | Okur, Salih ; Göktaş, Oktay; Güneş, Mehmet ; Finger, Friedhelm; Carius, Reinhard |
