Showing results 10 to 29 of 29
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Issue Date | Title | Author(s) |
Apr-1997 | Differences in the densities of charged defect states and kinetics of Staebler-Wronski effect in undoped (nonintrinsic) hydrogenated amorphous silicon thin films | Güneş, Mehmet ; Wronski, Christopher R. |
Apr-2006 | Diffusion length measurements of microcrystalline silicon thin films prepared by hot-wire/catalytic chemical vapor deposition (HWCVD) | Okur, Salih ; Güneş, Mehmet ; Finger, Friedhelm; Carius, Reinhard |
2005 | The effects of deposition conditions on the low energy absorption spectrum of microcrystalline silicon thin films prepared by HWCVD method | Işık, Nebile |
2005 | The effects of native and light induced defects in the optical and electronic properties of hydrogenated amorphous silicon germanium (a-SiGe:H) alloy thin films | Dönertaş Yavaş, Medine Elif |
Feb-2010 | The effects of native and light induced defects on optoelectronic properties of hydrogenated amorphous silicon-germanium (a-SiGe:H) alloy thin films | Güneş, Mehmet ; Yavaş, Mert; Klomfaß, Josef; Finger, Friedhelm |
Feb-2005 | The effects of oxide thickness on the interface and oxide properties of metal-tantalum pentoxide-Si (MOS) capacitors | Özdağ, Pınar; Atanassova, Elena; Güneş, Mehmet |
2007 | The effects of prior nitridation process of silicon surface and different metal gates on the Capacitance Voltage Characteristics of metal-Ta2O5-Si MOS capacitor | Özben, Eylem Durğun |
Mar-2004 | Electronic transport properties of microcrystalline silicon thin films prepared by VHF-PECVD | Okur, Salih ; Güneş, Mehmet ; Göktaş, Oktay; Finger, Friedhelm; Carius, Reinhard |
Feb-2005 | Instability phenomena in microcrystalline silicon films | Finger, Friedhelm; Carius, Reinhard; Dylla, Thorsten; Klein, Stefan; Okur, Salih ; Güneş, Mehmet |
Feb-2005 | Light induced degradation of hydrogenated amorphous silicon - Germanium alloy (a-SiGe:H) thin films | Dönertaş, M. Elif; Güneş, Mehmet |
2003 | Low temperature photoconductivity of hydrogenated amorphous silicon (a-Si:H) thin flims | Erdoğan, Gökhan |
Feb-2005 | Minority carrier properties of microcrystalline silicon thin films grown by HW-CVD and VHF-PECVD techniques | Okur, Salih ; Göktaş, Oktay; Güneş, Mehmet ; Finger, Friedhelm; Carius, Reinhard |
1997 | Native and light induced defect states in wide band gap hydrogenated amorphous silicon-carbon (a-Si1-xCx : H) alloy thin films | Güneş, Mehmet |
2002 | Noise in hydrogenated amorphous silicon | Johanson, Robert E.; Güneş, Mehmet ; Kasap, Safa O. |
Oct-2003 | Photoconductivity spectroscopy in hydrogenated microcrystalline silicon thin films | Güneş, Mehmet ; Akdaş, Deniz; Göktaş, Oktay; Carius, Reinhard; Klomfaß, Josef; Finger, Friedhelm |
Aug-2003 | Stability of microcrystalline silicon for thin film solar cell applications | Finger, Friedhelm; Carius, Reinhard; Dylla, Thorsten; Klein, Stefan; Okur, Salih ; Güneş, Mehmet |
Feb-2005 | Sub-bandgap absorption spectroscopy and minority carrier transport properties of hydrogenated microcrystalline silicon thin films | Güneş, Mehmet ; Göktaş, Oktay; Okur, Salih ; Işık, Nebile; Carius, Reinhard; Klomfaß, Josef; Finger, Friedhelm |
Apr-2006 | Sub-bandgap optical absorption spectroscopy of hydrogenated microcrystalline silicon thin films prepared using hot-wire CVD (Cat-CVD) process | Göktaş, Oktay; Işık, Nebile; Okur, Salih ; Güneş, Mehmet ; Carius, Reinhard; Klomfaß, Josef; Finger, Friedhelm |
2002 | Sub-gap absorption spectroscopy and its applications to amorphous semiconductor materials | Akdaş, Deniz |
2004 | Subgap absorption spectroscopy in microcrystalline silicon thin films | Göktaş, Oktay |