| Issue Date | Title | Author(s) |
| 1 | 2003 | 1/f noise in amorphous silicon and silicon-germanium alloys | Johanson, Robert E.; Güneş, Mehmet ; Kasap, Safa O. |
| 2 | May-2000 | 1/f Noise in doped and undoped amorphous silicon | Johanson, Robert E.; Güneş, Mehmet ; Kasap, Safa O. |
| 3 | Aug-2003 | 1/f noise in hydrogenated amorphous silicon-germanium alloys | Johanson, Robert E.; Güneş, Mehmet ; Kasap, Safa O. |
| 4 | 1999 | 1/f-noise study of undoped intrinsic hydrogenated amorphous silicon thin films | Güneş, Mehmet ; Johanson, Robert E.; Kasap, Safa O. |
| 5 | Oct-2003 | Conductance fluctuations in a-Si:H: Effects of alloying and device structure | Kasap, Safa O.; Güneş, Mehmet ; Johanson, Robert E.; Wang, Q.; Yang, Jeffrey; Guha, Subhendu |
| 6 | Apr-2002 | Conductance fluctuations in undoped hydrogenated amorphous silicon-germanium alloy thin films | Güneş, Mehmet ; Johanson, Robert E.; Kasap, Safa O.; Yang, Jeffrey C.; Guha, Subhendu |
| 7 | May-2000 | Conductance fluctuations in undoped intrinsic hydrogenated amorphous silicon films prepared using several deposition techniques | Güneş, Mehmet ; Johanson, Robert E.; Kasap, Safa O. |
| 8 | Oct-2003 | Conductance fluctuations in VHF-PECVD grown hydrogenated microcrystalline silicon thin films | Güneş, Mehmet ; Johanson, Robert E.; Kasap, Safa O.; Finger, Friedhelm; Lambertz, Andreas |
| 9 | Apr-1997 | Differences in the densities of charged defect states and kinetics of Staebler-Wronski effect in undoped (nonintrinsic) hydrogenated amorphous silicon thin films | Güneş, Mehmet ; Wronski, Christopher R. |
| 10 | Apr-2006 | Diffusion length measurements of microcrystalline silicon thin films prepared by hot-wire/catalytic chemical vapor deposition (HWCVD) | Okur, Salih ; Güneş, Mehmet ; Finger, Friedhelm; Carius, Reinhard |
| 11 | Feb-2010 | The effects of native and light induced defects on optoelectronic properties of hydrogenated amorphous silicon-germanium (a-SiGe:H) alloy thin films | Güneş, Mehmet ; Yavaş, Mert; Klomfaß, Josef; Finger, Friedhelm |
| 12 | Feb-2005 | The effects of oxide thickness on the interface and oxide properties of metal-tantalum pentoxide-Si (MOS) capacitors | Özdağ, Pınar; Atanassova, Elena; Güneş, Mehmet |
| 13 | Mar-2004 | Electronic transport properties of microcrystalline silicon thin films prepared by VHF-PECVD | Okur, Salih ; Güneş, Mehmet ; Göktaş, Oktay; Finger, Friedhelm; Carius, Reinhard |
| 14 | Feb-2005 | Instability phenomena in microcrystalline silicon films | Finger, Friedhelm; Carius, Reinhard; Dylla, Thorsten; Klein, Stefan; Okur, Salih ; Güneş, Mehmet |
| 15 | Feb-2005 | Light induced degradation of hydrogenated amorphous silicon - Germanium alloy (a-SiGe:H) thin films | Dönertaş, M. Elif; Güneş, Mehmet |
| 16 | Feb-2005 | Minority carrier properties of microcrystalline silicon thin films grown by HW-CVD and VHF-PECVD techniques | Okur, Salih ; Göktaş, Oktay; Güneş, Mehmet ; Finger, Friedhelm; Carius, Reinhard |
| 17 | 1997 | Native and light induced defect states in wide band gap hydrogenated amorphous silicon-carbon (a-Si1-xCx : H) alloy thin films | Güneş, Mehmet |
| 18 | 2002 | Noise in hydrogenated amorphous silicon | Johanson, Robert E.; Güneş, Mehmet ; Kasap, Safa O. |
| 19 | Oct-2003 | Photoconductivity spectroscopy in hydrogenated microcrystalline silicon thin films | Güneş, Mehmet ; Akdaş, Deniz; Göktaş, Oktay; Carius, Reinhard; Klomfaß, Josef; Finger, Friedhelm |
| 20 | Aug-2003 | Stability of microcrystalline silicon for thin film solar cell applications | Finger, Friedhelm; Carius, Reinhard; Dylla, Thorsten; Klein, Stefan; Okur, Salih ; Güneş, Mehmet |
